Microscopy Laboratories

Microscopy and Spectroscopy Laboratory

The microscopy and spectroscopy facilities include various optical microscopes, electron microscopes, scanning probe microscopes and Energy dispersive spectroscopy (EDS) and X-ray photoelectron spectroscopy (XPS). These facilities extensively serve for education and research in materials science, biomedical engineering and nanotechnology.

Multifunctional scanning probe microscope (SPM)

This instrument is located in Nanoscale Imaging & Characterization Laboratory under the direction of Nick Wu in the College of Engineering The multifunctional scanning probe microscope (Molecular imaging, PicoSPM® II) possesses the following capabilities: contact and non-contact mode AFM, force measurement and force array imaging, Acoustic AC mode AFM (tapping mode AFM), Electrostatic force microscopy (EFM), Scanning Kelvin Probe microscopy, Magnetic force microscopy (MFM), Scanning tunneling microscopy (STM), current sensing AFM (Conductive AFM), Electrochemical AFM (EC-AFM), AFM-based nanolithography. The universal microscope base permits easy integration with an environmental chamber or an inverted optical microscope. This SPM can be extensively applied to measurement of materials, devices and biological molecules.

Leitz Optical Microscope

The Leitz optical microscope used here is coupled with a CCD camera and an image grabber run from a PC. These micrographs are then viewed and evaluated using various image analysis softwares. Such data as grain size, precipitate volume fraction, and precipitate morphology are obtained from the pictures taken.

3-D Hi-Scope Microscope

The 3-D Hi-scope enables 360 degree dynamic rotation with oblique viewing. Tilted lightening and zoom lens make it versatile for both macro and micro examination. All digital imaging system is easy for operation and image processing. Software is equipped for dimension measurement.

Accu-scope Phase contrast optical microscope

The Accu-scope 3016 microscope, which is equipped with a CCD camera and the imaging analysis software, offers exceptional value, versatility and performance to meet the requirements of materials science and biology. It is capable of imaging under multiple modes such as phase contrast, polarization, bright field and dark field.

Hitachi S-4000 scanning electron microscope (SEM)

HITACHI S-4000 SEM is conventional electron microscope, which is used for daily sample examination and periodic class. Its features include 20x - 300kx magnification, 0.5 to 30kV Accelerating voltage, 4 position click stop heated aperture, 25mm x 25mm stage with -5 to 45 degree tilt, 12" built in TV monitor x 2, Digital frame store, Polaroid Camera and 4x5 film back.

Hitachi S-4700 field emission scanning electron microscope (FE-SEM)

The S-4700 FE-SEM is a shared facility located in Chemical Engineering Department. It combines the versatility of PC control with a novel electron optical column to give exceptional performance on large and small specimens. High resolution at 15kV is guaranteed at the EDX and specimen exchange position of 12mm working distance.

JOEL-100CX transmission electron microscopy (TEM)

JOEL-100CX is a shared facility located in Chemical Engineering Department. It is capable of accelerating voltages from 20-100kv. It can provide magnification from 100x to 600000x and a resolution of 0.2nm. It is primarily used in analysis of solid materials.

X-ray photoelectron spectroscopy (XPS)

The new XPS instrument is a WV Nano shared facility, which serves the users cross the campus and outside campus. It has the following capabilities:

  1. Identification of the elements and the chemical status of elements
  2. Quantification of chemical composition
  3. Destructive depth profiling using an ion gun (with Zalar rotation)
  4. Non-destructive depth profiling by the angle-resolved analysis
  5. Neutralization of surface charging with the flood guns
  6. Capable of performing ultraviolet photoelectron spectroscopy (UPS)
  7. XPS imaging
  8. Automated acquisition of XPS spectra
  9. Automated depth profiling
  10. Automatic peak fitting, elemental identification, depth profile calculation, as well as curve smoothing, and background removal with the loaded software


Nick Wu
Assistant Professor, Microscopy Laboratories

Phone:(304) 293-3326